发明名称 METHOD OF CHEMICAL MECHANICAL POLISHING A SUBSTRATE WITH POLISHING COMPOSITION ADAPTED TO ENHANCE SILICON OXIDE REMOVAL
摘要 A method for chemical mechanical polishing of a substrate is provided, comprising: providing a substrate, wherein the substrate comprises silicon oxide; providing a chemical mechanical polishing composition, comprising, as initial components: water; an abrasive; and a substance according to formula I wherein R1, R2 and R3 are each independently selected from a C1-4 alky group; providing a chemical mechanical polishing pad with a polishing surface; moving the polishing surface relative to the substrate; dispensing the chemical mechanical polishing composition onto the polishing surface; and, abrading at least a portion of the substrate to polish the substrate; wherein the substance according to formula I included in the chemical mechanical polishing composition provides an enhanced silicon oxide removal rate and an improved polishing defectivity performance; and, wherein at least some of the silicon oxide is removed from the substrate.
申请公布号 KR20110109859(A) 申请公布日期 2011.10.06
申请号 KR20110022818 申请日期 2011.03.15
申请人 ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC. 发明人 GUO YI;LIU ZHENDONG;REDDY KANCHARLA ARUN KUMAR;ZHANG GUANGYUN
分类号 H01L21/304 主分类号 H01L21/304
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