| 摘要 |
<p>Disclosed is an electron microscope that is a transmission type electron microscope that uses a polarized electron beam, and wherein a high contrast image can be obtained by recording the intensity distribution of an electron beam that was transmitted through a sample. The electron microscope is provided with a laser beam generating apparatus (2); a polarization apparatus (11) that polarizes a laser beam into a circularly polarized laser beam, and is capable of reversing the direction of the circular polarization over time; a semiconductor photocathode (16) provided with a strained superlattice semiconductor layer that generates a polarized electron beam when irradiated with a circularly polarized laser beam; a transmission type electron microscope (24) that utilizes the polarized electron beam; an electron-beam intensity-distribution recording apparatus (34) that is arranged at a face where a polarized electron beam that was transmitted through a sample reaches; and a reversal instruction apparatus (40) that sends an instruction to the polarization apparatus to reverse the direction of the circular polarization, and also sends an instruction to the electron-beam intensity-distribution recording apparatus in synchronization therewith. The electron-beam intensity-distribution recording apparatus records the intensity distribution of the polarized electron beam before and after the reversal thereof, and a difference acquisition apparatus (36) acquires the difference therebetween.</p> |
