发明名称 CIRCUIT SIMULATOR AND METHOD OF DESIGNING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a circuit simulator improving calculation accuracy of an impact ionization current.SOLUTION: In the circuit simulator, the impact ionization current Iii of a field effect transistor is calculated based on a drain transverse electric field Ecalculation formula in which a saturated source-drain voltage Vis given by a function of a source-gate voltage Vand a source-drain voltage V.
申请公布号 JP2011198948(A) 申请公布日期 2011.10.06
申请号 JP20100063021 申请日期 2010.03.18
申请人 TOSHIBA CORP 发明人 INOUE KOICHIRO
分类号 H01L21/336;G06F17/50;H01L21/82;H01L29/78 主分类号 H01L21/336
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