发明名称 Semiconductor package with under bump metallization aligned with open vias
摘要 A semiconductor package with a semiconductor chip having under bump metallizations (UBMs) on a first surface and a substrate having open vias. The substrate is attached to the semiconductor chip with the UBMs in alignment with the open vias. An encapsulant surrounds the semiconductor chip and the substrate and a conductor fills the open vias to form external package connections.
申请公布号 US8030768(B2) 申请公布日期 2011.10.04
申请号 US20080108563 申请日期 2008.04.24
申请人 UNITED TEST AND ASSEMBLY CENTER LTD. 发明人 ROBLES ROEL;RETUTA DANNY;CHEONG MARY ANNIE;TAN HIEN BOON;SUN ANTHONY YI SHENG;GAN RICHARD
分类号 H01L23/488;H01L21/56 主分类号 H01L23/488
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