发明名称 Wirebond over post passivation thick metal
摘要 A chip assembly includes a semiconductor chip and a wirebonded wire. The semiconductor chip includes a passivation layer over a silicon substrate and over a thin metal structure, a first thick metal layer over the passivation layer and on a contact point of the thin metal structure exposed by an opening in the passivation layer, a polymer layer over the passivation layer and on the first thick metal layer, and a second thick metal layer on the polymer layer and on the first thick metal layer exposed by an opening in the polymer layer. The first thick metal layer includes a copper layer with a thickness between 3 and 25 micrometers. The wirebonded wire is bonded to the second thick metal layer.
申请公布号 US8030775(B2) 申请公布日期 2011.10.04
申请号 US20080198899 申请日期 2008.08.27
申请人 MEGICA CORPORATION 发明人 LIN MOU-SHIUNG
分类号 H01L23/52;H01L23/48;H01L23/485;H01L29/40 主分类号 H01L23/52
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