发明名称 QUANTUM EFFICIENCY MEASUREMENT METHOD, QUANTUM EFFICIENCY MEASUREMENT APPARATUS, AND INTEGRATOR
摘要 A quantum efficiency measurement method includes the steps of: disposing a sample at a predetermined position in an integrator having an integrating space; applying excitation light to the sample and measuring a spectrum in the integrating space as a first spectrum through a second window; configuring an excitation light incident portion so that excitation light after having passed through the sample is not reflected in the integrating space; applying the excitation light to the sample and measuring a spectrum in the integrating space as a second spectrum through the second window; and calculating a quantum efficiency of the sample based on a component constituting a part of the first spectrum and corresponding to a wavelength range of the excitation light, and a component constituting a part of the second spectrum and corresponding to a wavelength range of light generated by the sample from the received excitation light.
申请公布号 US2011226961(A1) 申请公布日期 2011.09.22
申请号 US201113033612 申请日期 2011.02.24
申请人 OTSUKA ELECTRONICS CO., LTD. 发明人 OSAWA YOSHIHIRO;OHKUBO KAZUAKI
分类号 G01J1/58 主分类号 G01J1/58
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