| 摘要 |
<p>The present invention provides a method of analysing a sample comprising sub-micron or nanometre particles. First information about the size and number of particles in the sample is determined by nanoparticle tracking analysis (NTA) and second information about average particle size of particles in the sample is determined by dynamic light scattering (DLS). A third information representing the theoretical effect of the detected particles on results obtainable by dynamic light scattering is determined from the first information and the second information is adjusted using the third information to produce fourth information representing adjusted information on average particle size. The NTA device 2 and DLS device 4, such as a photon correlation spectrometer, may be located together, share common components and may gather data simultaneously relating to the Brownian motion of particles within the sample. The method allows for improved determination of particle sizes.</p> |
