| 摘要 |
In a method [400] for measuring jitter, a signal under test [220] is inputted [402] to generate signal transition locations. A signal transition location is latched [404] using a sampling clock signal [222], and the signal transition location is converted [406] to a delay value. The delay value is converted [408] to an edge position output [310], and a value of the edge position output [310] is detected [410].
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