发明名称 TEMPERATURE CONTROL SYSTEM, TEMPERATURE CONTROL METHOD, PLASMA PROCESSING APPARATUS AND COMPUTER STORAGE MEDIUM
摘要 There is provided a temperature control system configured to control a temperature of a temperature control target member of a processing chamber for performing a plasma process on a substrate therein. The temperature control system includes a heating unit configured to heat the temperature control target member; a cooling unit configured to cool the temperature control target member by circulating a liquid coolant; and a flow rate control unit configured to control a flow rate of the coolant into the temperature control target member by the cooling unit to a first flow rate when plasma is generated within the processing chamber and to a second flow rate lower than the first flow rate when plasma is not generated within the processing chamber.
申请公布号 US2011220288(A1) 申请公布日期 2011.09.15
申请号 US201113042799 申请日期 2011.03.08
申请人 TOKYO ELECTRON LIMITED 发明人 KOBAYASHI ATSUSHI;WAKAI HIDEKI
分类号 C23F1/08;F25B29/00 主分类号 C23F1/08
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