发明名称 SEMICONDUCTOR DEVICE AND PRODUCTION METHOD FOR SAME
摘要 <p>The disclosed semiconductor device is provided with: a first conductive type drift diffusion region (10); a second conductive type body diffusion region (2); a first conductive type source diffusion region (6); an insulating film (14) which is embedded in a trench formed in the upper part of the drift diffusion region (10) and is formed in a location that is separate from the body diffusion region (2); a first conductive type drain diffusion region (7), which is formed in the upper part of the drift diffusion region (10) and is adjacent to the insulating film (14) in the opposite direction to the source diffusion region (6); and a gate electrode (5) which is formed so as to go from above the body diffusion region (2), over the drift diffusion region (10) and up to above the insulating film (14). The drift diffusion region (10) has a substrate inner region (11), and a surface region (12) which contains first conductive type impurities at a higher concentration than the substrate inner region (11).</p>
申请公布号 WO2011111135(A1) 申请公布日期 2011.09.15
申请号 WO2010JP06419 申请日期 2010.10.29
申请人 PANASONIC CORPORATION;YAMASHINA, DAIGO;INOUE, MASAKI 发明人 YAMASHINA, DAIGO;INOUE, MASAKI
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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