发明名称 |
MAGNETIC HEAD INSPECTION METHOD AND MAGNETIC HEAD MANUFACTURING METHOD |
摘要 |
A magnetic head inspection method is provided with the step that an area smaller than a half of a scanning and measurement area of a magnetic probe in a cantilever unit of the MFM is set as a scanning and measurement area on a surface of a recording portion of the magnetic head that is scanned by the AFM, so as to greatly reduce the inspection time (tact time) of the AFM.
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申请公布号 |
US2011225684(A1) |
申请公布日期 |
2011.09.15 |
申请号 |
US201113024589 |
申请日期 |
2011.02.10 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
NAKAGOMI TSUNEO;MATSUSITA NORIMITSU |
分类号 |
G01Q60/54;G01Q60/50 |
主分类号 |
G01Q60/54 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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