发明名称 OPTICAL ELEMENT INSPECTION TOOL
摘要 PROBLEM TO BE SOLVED: To achieve electrical connection and incidence of light having a large numerical aperture even to a miniaturized or surface mounted DUT by using an optical material having a large diameter that passes through a light as a member that pushes DUT to a stage, thereby allowing to use without being limited by the reduction of light quantity or size of a light source and to measure electric characteristics and optical characteristics and to perform external observation. SOLUTION: An optical element inspection tool includes the stage for measuring characteristics of DUT in which an optical element is encapsulated, a guide part for positioning the DUT, and an optical member for pushing the DUT to the stage and contacting to the DUT, and having a diameter so as to expose the DUT. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011179872(A) 申请公布日期 2011.09.15
申请号 JP20100042236 申请日期 2010.02.26
申请人 RENESAS ELECTRONICS CORP 发明人 YOSHIDA YOHIKO
分类号 G01R31/26 主分类号 G01R31/26
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