METHOD AND APPARATUS FOR TESTING A MEMORY DEVICE

摘要

In a particular embodiment, a method includes receiving a testing activation signal (134) at a controller (108) coupled to a semiconductor device (104). The method further includes biasing a well (142) of at least one transistor of the semiconductor device in response to the received testing activation signal. The bias is provided by a biasing circuit (106) that is responsive to the controller. While the well is biased, a test of the semiconductor device is performed to generate testing data.