发明名称 SILICON CARBIDE SEMICONDUCTOR DEVICE WITH SCHOTTKY BARRIER DIODE, AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To achieve both reduction in Schottky barrier height and reduction in leakage current. SOLUTION: An interface layer comprising SiC<SB>X</SB>is not formed on an interface between a Schottky electrode 4 and SiC, and respective particles of metal forming the Schottky electrode 4 are made to be in a state of lattice matching such that an atom arrangement is continuous, on a surface of the SiC. Specifically, a particle structure of the metal forming the Schottky electrode 4 is not made to be a columnar structure but is made to be a granular structure, and oxygen is made to be hardly taken in the interface through interfaces between the particles as compared with the columnar structure so that SiO<SB>X</SB>is not formed, thereby the lattice matching between the metal forming the Schottky electrode 4 and the SiC is achieved. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011176015(A) 申请公布日期 2011.09.08
申请号 JP20100037388 申请日期 2010.02.23
申请人 DENSO CORP;TOYOTA MOTOR CORP;TOYOTA CENTRAL R&D LABS INC 发明人 YAMAMOTO TAKEO;ENDO TAKESHI;MORIMOTO ATSUSHI;FUJIWARA HIROKAZU;WATANABE YUKIHIKO;KATSUNO TAKASHI;ISHIKAWA TAKESHI
分类号 H01L29/47;H01L29/872 主分类号 H01L29/47
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