发明名称 Semiconductor integrated circuit
摘要 The invention provides a semiconductor integrated circuit preventing an electrostatic breakdown due to a surge voltage applied to a power supply wiring or a ground wiring and preventing noise interference between a digital circuit and an analog circuit. By providing a first electrostatic breakdown protection diode and a first electrostatic breakdown protection bipolar transistor in a first island region, the first electrostatic breakdown protection diode and the first electrostatic breakdown protection bipolar transistor turn on when a surge voltage is applied to a first ground wiring and protect a digital circuit against an electrostatic breakdown. Furthermore, a first isolation layer is contacted with the first ground wiring in a position that is more adjacent to a first ground pad than the digital circuit, and a second isolation layer is contacted with a second ground wiring in a position that is more adjacent to a second ground pad than an analog circuit. This prevents noise interference between the digital circuit and the analog circuit.
申请公布号 US8014114(B2) 申请公布日期 2011.09.06
申请号 US20080268709 申请日期 2008.11.11
申请人 SANYO ELECTRIC CO., LTD.;SANYO SEMICONDUCTOR CO., LTD. 发明人 SHIMAMURA TETSUO
分类号 H02H9/00;H02H1/00;H02H1/04;H02H3/22 主分类号 H02H9/00
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