| 摘要 |
PROBLEM TO BE SOLVED: To solve a problem of a semiconductor laser that has an initial failure rate a little higher than a conventional one with an active layer material, because there is a semiconductor having an initial failure mode that is almost independent from a temperature, and proceeding depending on the amount of internal optical power that is the amount of an optical output observed at the outside, and the larger the amount of the output light, the more the inadequate of the screening of the proceeding failure mode. SOLUTION: It is effective to adapt a large optical output test at a low temperature that is lower than that of an average operation temperature as room temperature in a manufacturing step. Thus, an element having initial failure mode that proceeds more as the amount of the light output is large is eliminated to elongate an expected life. COPYRIGHT: (C)2011,JPO&INPIT |
