| 摘要 |
PROBLEM TO BE SOLVED: To provide an image sensor having superior focus detection accuracy even if the miniaturization of pixels is progressed, a method of manufacturing the same, and an image pickup apparatus equipped with the same. SOLUTION: A backside-irradiation-type image sensor includes a plurality of pixels disposed in a two-dimensional arrangement where the plurality of pixels include pixels 211 for focus detection in addition to pixels for image sensing. The pixels for image sensing and pixels 211 for focus detection are provided with a semiconductor layer 16 on the front side surface of which photoelectric conversion sections 15a are formed while the backside surface of which is defined as a light receiving surface, and provided with a wiring layer 17 which includes wiring for reading out signals from the photoelectric conversion sections 15a. The wiring layer 17 for the pixels for image sensing and that for the pixels for focus detection are formed on respective portions of the front side surface of the semiconductor layer 16. The pixels for image sensing are provided with color filters that pass the light of specific wavelength regions on the backside surface side of the semiconductor layer, while the pixels 211 for focus detection are provided with light shielding films 18 that cut off a part of the light incident on the backside surface of the semiconductor layer 16 in a layer that corresponds to the color filter for the pixels for image sensing. COPYRIGHT: (C)2011,JPO&INPIT |
