| 摘要 |
<p>A method of forming a semiconductor sensor (100) includes providing a substrate, (102) forming a reflective layer (104) on the substrate, forming a sacrificial layer on the reflective layer, forming an absorber layer (106) with a thickness of less than about 50 nm on the sacrificial layer, forming an absorber in the absorber layer integrally with at least one suspension leg, (110) and removing the sacrificial layer.</p> |
