发明名称 POLYMER, CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND PATTERN FORMING PROCESS
摘要 A polymer comprising recurring units having a fluorinated carboxylic acid onium salt structure on a side chain is used to formulate a chemically amplified positive resist composition. When the composition is processed by lithography to form a positive pattern, the diffusion of acid in the resist film is uniform and slow, and the pattern is improved in LER.
申请公布号 US2011212391(A1) 申请公布日期 2011.09.01
申请号 US201113035066 申请日期 2011.02.25
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 MASUNAGA KEIICHI;WATANABE SATOSHI;HATAKEYAMA JUN;OHSAWA YOUICHI;DOMON DAISUKE
分类号 G03F7/20;C08F20/22;C08F20/28;C08F20/38;C08F220/20;G03F1/00;G03F7/004;G03F7/039;H01L21/027 主分类号 G03F7/20
代理机构 代理人
主权项
地址