发明名称 Mechanism for fixing probe card
摘要 In a mechanism for fixing a probe card, the probe card and a support frame are joined to each other about the axis of each of the probe card and the support frame by a plurality of first fastening members. Also, the outer circumferential edge portion of the support frame is fixed by a plurality of second fastening members to a holder fixed to a probe unit. The probe card is held by the mechanism such that the central region of the probe card is restricted by the first fastening members and the outer circumferential portion of the probe card is not restricted so as to be rendered free. It follows that the probe card is expanded toward the outer circumferential edge portion by thermal expansion under a high-temperature. However, the probe card is prevented from being deformed in the shape of a dome.
申请公布号 USRE42655(E1) 申请公布日期 2011.08.30
申请号 US20060638658 申请日期 2006.12.14
申请人 TOKYO ELECTRON LIMITED 发明人 YONEZAWA TOSHIHIRO
分类号 G01R1/073;G01R31/02;G01R31/28;H01L21/66 主分类号 G01R1/073
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