发明名称 Metrics independent and recipe independent fault classes
摘要 A method and apparatus for diagnosing faults. Process data is analyzed using a first metric to identify a fault. The process data was obtained from a manufacturing machine running a first recipe. A fault signature that matches the fault is identified. The identified fault signature was generated using a second metric and/or a second recipe. At least one fault class that is associated with the fault signature is identified.
申请公布号 US8010321(B2) 申请公布日期 2011.08.30
申请号 US20070800460 申请日期 2007.05.04
申请人 APPLIED MATERIALS, INC. 发明人 LIN Y. SEAN;CLEMENTS, III WILLIAM R.;SCHWARM ALEXANDER T.
分类号 G06F3/01;G06F11/07;G21C21/02;H04B3/46 主分类号 G06F3/01
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