发明名称 ATMOSPHERIC PRESSURE CHEMICAL VAPOR DEPOSITION WITH SATURATION CONTROL
摘要 <p>A process for coating a substrate heated to a temperature below the condensation temperature of a semiconductor material at atmospheric pressure is disclosed, the process including the steps of mixing a mass of semiconductor material and a heated inert gas stream, vaporizing the controlled mass of semiconductor material within the inert gas to generate a sub-saturated fluid mixture, directing the sub-saturated fluid mixture at the substrate, wherein the substrate is at substantially atmospheric pressure, depositing a layer of the semiconductor material onto a surface of the substrate, extracting undeposited semiconductor material, and repeating the steps of generating, directing, depositing, and extracting, to minimize an amount of undeposited semiconductor material.</p>
申请公布号 WO2011103386(A1) 申请公布日期 2011.08.25
申请号 WO2011US25383 申请日期 2011.02.18
申请人 CALYXO GMBH;KORMANYOS, KENNETH, R.;REITER, NICHOLAS, A. 发明人 KORMANYOS, KENNETH, R.;REITER, NICHOLAS, A.
分类号 H01L21/20 主分类号 H01L21/20
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