发明名称 SIGNAL GENERATOR AND TEST APPARATUS USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a signal generator where noise is reduced. SOLUTION: An optional waveform generator 100 supplies an analog test signal Sout to a DUT 2. An output amplifier 18 amplifies an analog test signal Sin. A low-pass filter 4 filters an output signal S12 of an output amplifier 18, and removes noise. A first resistor R1 is disposed in series on a signal route of the subsequent stage of the low-pass filter 4. The input matched impedance Zi of the low-pass filter 4 is substantially matched with an output matched impedance Ro of the circuit block of the preceding stage. An output matched impedance Zo of the low-pass filter 4 is sufficiently higher than the input matched impedance Zi. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011164039(A) 申请公布日期 2011.08.25
申请号 JP20100029710 申请日期 2010.02.15
申请人 ADVANTEST CORP 发明人 KAWABATA MASAYUKI;UEKUSA KOICHIRO;HOSAKA TOMOYA
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址