发明名称 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR MANUFACTURING CURED RELIEF PATTERN AND SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a photosensitive resin composition excellent in in-plane uniformity of film thickness when coating, and in storage stability, a method for manufacturing a cured relief pattern and a semiconductor device. <P>SOLUTION: The photosensitive resin composition contains 100 pts.mass of an alkali-soluble resin (A) containing a resin having one or more kinds of structures selected from a group consisting of a polyimide structure, a polybenzoxazole structure, a polyimide precursor structure and a polybenzoxazole precursor structure, 10-1,000 pts.mass of a solvent (B) containing at least one kind of compound selected from a group consisting of compounds represented by tetrahydrofurfuryl alcohol, furfural and furan carboxylic acid alkyl ester, and 0.1-100 pts.mass of a photosensitizing agent (C). <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011164289(A) 申请公布日期 2011.08.25
申请号 JP20100025778 申请日期 2010.02.08
申请人 ASAHI KASEI E-MATERIALS CORP 发明人 KATAOKA YASUHIRO;SHIBUI TOMOHITO
分类号 G03F7/004;C08G73/10;G03F7/023;G03F7/038;G03F7/40;H01L21/027 主分类号 G03F7/004
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