发明名称 SEMICONDUCTOR MEMORY DEVICE FROM WHICH EDGE DUMMY MEMORY CELL BLOCK IS REMOVED
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor memory device having an open bitline structure from which an edge dummy memory cell block is removed. <P>SOLUTION: The semiconductor memory device is equipped with: the memory cell block including a memory cell array; an edge sense amplification block including one or more first sense amplifiers, each first sense amplifier having a first bitline, a first complementary bitline, and a first amplification circuit comprising a first transistor having a first size; a central sense amplification block including one or more second sense amplifiers, each second sensor amplifier having a second bitline, a second complementary bitline, and a second amplification circuit comprising a second transistor having a second size different each other from the first size; and a capacitor block including at least one capacitor while electrically being connected with the edge sense amplification block. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011165311(A) 申请公布日期 2011.08.25
申请号 JP20110026378 申请日期 2011.02.09
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 RI TETSUU;JANG SEONG-JIN;KWAK JIN-SEOK;KO TAI-YOUNG;KIM JOUNG-YEAL;KIM SANG-YUN;BOKU SHOKIN;RI TEIBAI
分类号 G11C11/4097;G11C11/4099;H01L21/8242;H01L27/108 主分类号 G11C11/4097
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