发明名称 |
NONVOLATILE MEMORY DEVICE, PROGRAMMING METHOD THEREOF AND MEMORY SYSTEM INCLUDING THE SAME |
摘要 |
PURPOSE: A nonvolatile memory device, a programming method thereof and a memory system including the same are provided to reduce leakage between a channel voltage and a bit line voltage by applying a positive voltage to a selected bit line in programming. CONSTITUTION: In a nonvolatile memory device, a programming method thereof and a memory system including the same, a first voltage is applied to a selection bit line(S110). A second voltage is applied to a non-selection bit line(S120). A third voltage is applied to the string selection line corresponding to a selected memory cell. A fourth voltage is applied to the string selection line corresponding to an unselected memory cell. A program operating voltage is applied to the word lines(S130). The first to third voltage is a positive voltage. |
申请公布号 |
KR20110094989(A) |
申请公布日期 |
2011.08.24 |
申请号 |
KR20100014755 |
申请日期 |
2010.02.18 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HAN JINMAN;KIM, DOO GON |
分类号 |
G11C16/12;G11C16/02;G11C16/10 |
主分类号 |
G11C16/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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