发明名称 Strained Semiconductor Structures and Method of Fabricating Strained Semiconductor Structures
摘要 A strained semiconductor structure and method of making the structure. The method includes: forming a pad layer on a top surface of a silicon layer of a substrate, the substrate comprising the silicon layer separated from a supporting substrate by a buried oxide layer; forming openings in the pad layer and etching trenches through the silicon layer to the buried oxide layer in the openings to form silicon regions from the silicon layer; forming spacers on the entirety of sidewalls of the silicon regions exposed in the trenches; forming oxide regions in corners of the silicon regions proximate to both the sidewalls and the buried oxide layer to form strained silicon regions, the oxide regions not extending to the pad layer; and removing at least a portion of the spacers and filling remaining spaces in the trenches with silicon to form filled regions abutting the strained silicon region.
申请公布号 US2011198695(A1) 申请公布日期 2011.08.18
申请号 US20100707975 申请日期 2010.02.18
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ANDERSON BRENT ALAN;NOWAK EDWARD JOSEPH
分类号 H01L29/786;H01L21/336 主分类号 H01L29/786
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