发明名称 CONTACT PROBE
摘要 PROBLEM TO BE SOLVED: To provide a contact probe pin simplified in assembling and improved in reliability. SOLUTION: The contact probe pin has structure of pressure-contacting with an object to be tested where a plunger b having a spring f inserted into a cylindrical barrel a slides freely. In the contact probe pin, a stopper ring c is forced into the inner periphery of an edge of the barrel a for preventing omission from the barrel a of the plunger b, thus making a diameter of the inside of the barrel an uneven. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011158454(A) 申请公布日期 2011.08.18
申请号 JP20100034045 申请日期 2010.02.01
申请人 INTERNET KK;OS SEIKO CO LTD 发明人 HAYAKAWA SEIZO;OKAMURA SABURO
分类号 G01R1/067;H01L21/66 主分类号 G01R1/067
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