发明名称 Method of manufacturing semiconductor device in which functional portion of element is exposed
摘要 A method of manufacturing a semiconductor device includes: forming a first resin layer on a wafer having a light receiving portion; patterning the first resin layer into a predetermined shape and forming a first resin film on the light receiving portion; dividing the wafer into light receiving elements; mounting the light receiving elements on an upper surface of a lead frame; a sealing step of forming a sealing resin layer around the first resin film; and removing the first resin film such that a portion of the light receiving element is exposed to the outside, and in the sealing step, the upper surface of the first resin film is flush with the upper surface of the sealing resin layer, or the upper surface of the first resin film is higher than the upper surface of the sealing resin layer.
申请公布号 US7998781(B2) 申请公布日期 2011.08.16
申请号 US20090540878 申请日期 2009.08.13
申请人 RENESAS ELECTRONICS CORPORATION 发明人 UCHIDA KENJI;HIRASAWA KOKI
分类号 H01L21/00 主分类号 H01L21/00
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