发明名称 Flash Memory Devices Having Multi-Bit Memory Cells Therein with Improved Read Reliability
摘要 Integrated circuit memory devices include an array of nonvolatile N-bit memory cells, where N is an integer greater than one. Control circuitry is also provided to reliably read data from the N-bit memory cells. This control circuitry, which is electrically coupled to the array, is configured to determine, among other things, a value of at least one bit of data stored in a selected N-bit memory cell in the array. This is done by decoding at least one hard data value and a plurality of soft data values (e.g., 6 data values) read from the selected N-bit memory cell using a corresponding plurality of unequal read voltages applied to the selected N-bit memory cell during a read operation.
申请公布号 US2011197015(A1) 申请公布日期 2011.08.11
申请号 US20100967969 申请日期 2010.12.14
申请人 CHAE DONGHYUK;HAN JINMAN 发明人 CHAE DONGHYUK;HAN JINMAN
分类号 G06F12/00;G11C16/04;G11C16/06 主分类号 G06F12/00
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