发明名称 |
NITRIDE SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a nitride semiconductor device having a substrate high in heat radiation capability and small in a crystal defect of a nitride semiconductor layer formed on the substrate, and to provide a method of manufacturing the same. <P>SOLUTION: A method of manufacturing an HEMT 10 includes: a film formation process of forming a thin film 12 of GaN on a surface of a sapphire substrate 11; a groove formation process of forming a groove at a depth reaching the inside of the sapphire substrate 11 from the upper end of the thin film 12; a growth process of growing a GaN layer 13 using the thin film 12 as a seed crystal after the groove formation process; and a filling process of filling Au as a high-thermal-conductivity material high in thermal conductivity relative to sapphire in the groove 17 before or after the growth process. <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011155164(A) |
申请公布日期 |
2011.08.11 |
申请号 |
JP20100016217 |
申请日期 |
2010.01.28 |
申请人 |
TOYOTA CENTRAL R&D LABS INC;TOYOTA MOTOR CORP |
发明人 |
ITO KENJI;KIKUTA DAIGO;UESUGI TSUTOMU;SUGIMOTO MASAHIRO |
分类号 |
H01L21/338;H01L29/778;H01L29/812 |
主分类号 |
H01L21/338 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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