发明名称 HALL ELEMENT DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce an effect of a variation of package stress to a Hall element while a Hall electromotive force varies accompanied by the variation of the package stress in a reliability test or the like. SOLUTION: Resistors constituting a resistive element for the temperature correction of the Hall electromotive force of a symmetric Hall element are arranged on a silicon substrate in such a way as to be adjacent with the symmetric Hall element. A plurality of resistors constituted in a bridge type are especially arranged in such a way as to surround the periphery of the Hall element. The Hall element is arranged on the silicon substrate so that a drive current flowing through the Hall element may flow in a direction <011>. The resistive element for temperature correction is arranged in such a way that the direction of a current flowing through the resistive element may be in parallel with, perpendicular, or form an angle of 45°with respect to the current direction of a drive current of the Hall element. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011149766(A) 申请公布日期 2011.08.04
申请号 JP20100010208 申请日期 2010.01.20
申请人 ASAHI KASEI ELECTRONICS CO LTD 发明人 NOHIRA RYUJI
分类号 G01R33/07 主分类号 G01R33/07
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