发明名称 INTERNAL DEFECT EVALUATION METHOD BY EDDY CURRENT METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method which can evaluate an internal defect easily and speedily. SOLUTION: Noise signals and flaw signals are extracted from signals acquired by measuring the surface of a steel product by the use of an eddy current probe to determined an S/N ratio with a peak value of the flaw signals as S and a peak value of the noise signals as N. In the case that a value of the n-th power (n>1) of the S/N ratio is 2.5, 3.0 or larger, the presence of the internal defect is determined. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011149838(A) 申请公布日期 2011.08.04
申请号 JP20100011602 申请日期 2010.01.22
申请人 JAPAN ATOM POWER CO LTD:THE 发明人 MORISAWA JUNICHIRO;ONO MANABU
分类号 G01N27/90 主分类号 G01N27/90
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