发明名称 X-RAY IMAGING APPARATUS AND WAVEFRONT MEASURING APPARATUS
摘要 <p>There is provided an X-ray imaging apparatus which images a specimen. The X-ray imaging apparatus comprises: an X-ray source; a diffraction grating configured to diffract an X-ray from the X-ray source; an X-ray detector configured to detect the X-ray diffracted by the diffraction grating; and a calculator configured to calculate phase information of the specimen on the basis of an intensity distribution of the X-ray detected by the X-ray detector, wherein the calculator obtains a spatial frequency spectrum from the plural intensity distributions, and calculates the phase information from the obtained spatial frequency spectrum.</p>
申请公布号 WO2011093417(A1) 申请公布日期 2011.08.04
申请号 WO2011JP51680 申请日期 2011.01.21
申请人 CANON KABUSHIKI KAISHA;OUCHI, CHIDANE;KOHARA, NAOKI 发明人 OUCHI, CHIDANE;KOHARA, NAOKI
分类号 A61B6/06;G01N23/20;G21K1/06 主分类号 A61B6/06
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