发明名称 |
X-RAY IMAGING APPARATUS AND WAVEFRONT MEASURING APPARATUS |
摘要 |
<p>There is provided an X-ray imaging apparatus which images a specimen. The X-ray imaging apparatus comprises: an X-ray source; a diffraction grating configured to diffract an X-ray from the X-ray source; an X-ray detector configured to detect the X-ray diffracted by the diffraction grating; and a calculator configured to calculate phase information of the specimen on the basis of an intensity distribution of the X-ray detected by the X-ray detector, wherein the calculator obtains a spatial frequency spectrum from the plural intensity distributions, and calculates the phase information from the obtained spatial frequency spectrum.</p> |
申请公布号 |
WO2011093417(A1) |
申请公布日期 |
2011.08.04 |
申请号 |
WO2011JP51680 |
申请日期 |
2011.01.21 |
申请人 |
CANON KABUSHIKI KAISHA;OUCHI, CHIDANE;KOHARA, NAOKI |
发明人 |
OUCHI, CHIDANE;KOHARA, NAOKI |
分类号 |
A61B6/06;G01N23/20;G21K1/06 |
主分类号 |
A61B6/06 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|