发明名称 |
PROCESS FOR PRODUCING SILICON OXIDE THIN FILM OR SILICON OXYNITRIDE COMPOUND THIN FILM AND THIN FILM OBTAINED BY THE PROCESS |
摘要 |
Disclosed is a process for producing a silicon oxide or silicon oxynitride thin film having a high level of water vapor and oxygen barrier property and a high strength with a higher efficiency by a solution process which is advantageous in productivity. Also disclosed is a thin film that is obtained by the process and is useful, for example, as a protective film for electric elements such as organic EL elements. A solution containing a smectite group silicate layered compound and a silazane compound is coated onto a surface of a substrate by a liquid phase process to form a film. The thin film thus obtained is exposed to ultraviolet light under an oxygen atmosphere to produce a silicon oxide thin film or a silicon oxynitride compound thin film containing the smectite group silicate layered compound. The smectite group silicate compound is a material represented by the following general formula. A1/3BmSi4O10.nH2O  [Chemical Formula 1] |
申请公布号 |
US2011185948(A1) |
申请公布日期 |
2011.08.04 |
申请号 |
US200913061495 |
申请日期 |
2009.08.28 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCEAND TECHNOLOGY |
发明人 |
UEMURA SEI;KAMATA TOSHIHIDE |
分类号 |
C09D1/02;C08F2/48 |
主分类号 |
C09D1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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