发明名称 Method for fabricating pixel cell of CMOS image sensor
摘要 The present invention provides a method for fabricating a pixel cell of CMOS image sensor, comprising: preparing a semiconductor substrate divided into region I and region II; forming an insulation layer on the surface of the semiconductor substrate in the region I and a gate dielectric layer on the surface of the semiconductor substrate in the region II; forming a poly-silicon gate on the surface of the semiconductor substrate in the region II; forming a deep doped well in the region I through an ion implantation with high energy; performing an ion implantation with low energy in the region I and an ion implantation for lightly doped source/drain in the region II simultaneously; and forming source/drain regions in the semiconductor substrate in the region II.
申请公布号 US7989252(B2) 申请公布日期 2011.08.02
申请号 US20070871121 申请日期 2007.10.11
申请人 SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION 发明人 YANG JIANPING;HUO JIEGUANG
分类号 H01L21/00;H01L21/8234 主分类号 H01L21/00
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