发明名称 Method for manufacturing silicon on sapphire wafer
摘要 The present invention provides an SOS wafer comprising a non-transparent polysilicon layer provided on a back surface of a sapphire substrate, a silicon nitride layer which protects the polysilicon layer, and a stress relaxing film which cancels stress produced in the silicon nitride layer, wherein the silicon nitride layer and the stress relaxing film are provided on the back surface side.
申请公布号 US7989324(B2) 申请公布日期 2011.08.02
申请号 US20090458321 申请日期 2009.07.08
申请人 OKI SEMICONDUCTOR CO., LTD. 发明人 SHIMOKAWA KIMIAKI
分类号 H01L21/20;H01L21/36 主分类号 H01L21/20
代理机构 代理人
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