发明名称 Manufacturing method for compound semiconductor device and etching solution
摘要 After an n-type AlGaN barrier layer (3) is formed over a substrate (1), an n-type GaN contact layer (4) is formed over the n-type AlGaN barrier layer (3). Next, the n-type GaN contact layer (4) is wet-etched with using an etching solution containing an organic alkali agent and an oxidizer while the n-type GaN contact layer (4) is irradiated with an ultraviolet illumination.
申请公布号 US7985637(B2) 申请公布日期 2011.07.26
申请号 US20080207085 申请日期 2008.09.09
申请人 FUJITSU LIMITED 发明人 OKAMOTO NAOYA
分类号 H01L21/338 主分类号 H01L21/338
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