| 摘要 |
A universal frame for connecting a semiconductor device to a test device, the universal frame including a connector for establishing a connection between the semiconductor device and the test device; a head part fixing a position of the connector; a body part fixing a position of the head part, the body part being configured to accommodate the semiconductor device; and a guide unit within the body part, the guide unit being configured to receive the semiconductor device at an end of the body part opposite to an end of the body part fixing the position of head part, and being configured to accommodate the semiconductor device
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