发明名称 |
Device for determining e.g. refraction index of V or wedge shaped samples, has adjusting device adjusting rotational angle of deflecting mirror, and measuring telescope firmly arranged opposite to beam directed towards prism |
摘要 |
<p>The device has a retainer (50) defined by inner prism surfaces (52, 53) diagonally arranged to each other. A light source (9) and a V-block prism (5) are arranged relative to each other such that light beam (11) radiated from the source passes through a light entrance surface (51), the prism surfaces and a light exit surface (54). A measuring unit (15) determines a deflection angle of the beam withdrawing from the exit surface. An adjusting device adjusts a rotational angle of a deflecting mirror (13). A measuring telescope is firmly arranged opposite to the beam directed towards the prism. An independent claim is also included for a method for determination of a refraction index of a sample.</p> |
申请公布号 |
DE102010004824(A1) |
申请公布日期 |
2011.07.21 |
申请号 |
DE20101004824 |
申请日期 |
2010.01.15 |
申请人 |
SCHOTT AG |
发明人 |
ENGEL, AXEL, DR.;WESTENBERGER, GERHARD;BARTELMESS, LOTHAR;FISCHER, PETER |
分类号 |
G01N21/41 |
主分类号 |
G01N21/41 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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