发明名称 |
Phase contrast imaging and preparing a tem therefor |
摘要 |
New methods for phase contrast imaging in transmission electron microscopy use the imaging electron beam itself to prepare a hole-free thin film for use as an effective phase plate, in some cases eliminating the need for ex-situ fabrication of a hole and reducing requirements for the precision of the ZPP hardware. The electron optical properties of the ZPP hardware are modified primarily in two ways: by boring a hole using the electron beam; and/or by modifying the electro-optical properties by charging induced by the primary beam. Furthermore a method where the sample is focused by a lens downstream from the ZPP hardware is disclosed. A method for transferring a back focal plane of the objective lens to a selected area aperture plane and any plane conjugated with the back focal plane of the objective lens is also provided.
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申请公布号 |
US2011174971(A1) |
申请公布日期 |
2011.07.21 |
申请号 |
US20110930749 |
申请日期 |
2011.01.15 |
申请人 |
MALAC MAREK;BELEGGIA MARCO;KAWASAKI MASAHIRO;EGERTON RAY |
发明人 |
MALAC MAREK;BELEGGIA MARCO;KAWASAKI MASAHIRO;EGERTON RAY |
分类号 |
H01J37/26 |
主分类号 |
H01J37/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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