发明名称 Semiconductor memory device and manufacturing method thereof
摘要 A semiconductor memory device includes a first block having first memory cells and first select transistors, a second block having second memory cells and second select transistors, and arranged adjacent to the first block in a first direction, the second select transistor being arranged to face the first select transistor and commonly having a diffusion region with the first select transistor, a first interconnection layer provided on the diffusion region between the first and second blocks and extending in a second direction, and a second interconnection layer having a first portion provided in contact with an upper portion of the first interconnection layer and extending to a portion outside the first interconnection layer, and a second portion extending in the second direction and connected to the first portion in a portion outside a portion on the first interconnection layer.
申请公布号 US7982244(B2) 申请公布日期 2011.07.19
申请号 US20090553496 申请日期 2009.09.03
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SATO ATSUHIRO;NITTA HIROYUKI;ARAI FUMITAKA
分类号 H01L29/68;H01L27/105;H01L29/417 主分类号 H01L29/68
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