| 摘要 |
It is possible to provide a semiconductor test device capable improving the test efficiency. The semiconductor test device includes: a driver (14) which generates a driver signal outputted to a device under test; a variable delay circuit (12) provided at the preceding stage of the driver (14); a register (16) for setting an output level of a driver signal outputted from the driver (14); a correction value memory (26) which outputs correction data corresponding to a shift of the rise timing or the fall timing of the driver signal when the output level is modified from a predetermined value serving as a reference value of the output level; an amplitude correction value register (28) which sets a delay amount by a variable delay circuit (12) by considering correction data which is outputted from the correction value memory (26); an adder circuit (30).
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