发明名称 |
Nanoscale optical tomography based on volume-scanning near-field microscopy |
摘要 |
An apparatus and methods for nanoscale optical tomography based on back-scattering mode near-field scanning optical microscopy with a volumetric scan of the probe. The back-scattered data collected by a volumetric scan of the probe contains three-dimensional structural information of the sample, which enables reconstruction of the dielectric sample without other mechanical movements of the instrument.
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申请公布号 |
US7978343(B2) |
申请公布日期 |
2011.07.12 |
申请号 |
US20090405449 |
申请日期 |
2009.03.17 |
申请人 |
THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS |
发明人 |
SUN JIN;SCHOTLAND JOHN C.;HILLENBRAND RAINER;CARNEY PAUL SCOTT |
分类号 |
G01B11/24 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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