| 摘要 |
Provided is a method for measuring the spin resonance phenomenon of an unpaired electron to perform micro evaluation in the state observation of the charge carrier in an organic film interface while receiving light irradiation, or the light emission from an organic thin film element. Also provided is an electron spin measurement device and measurement method in order to improve the characteristics. The electron spin measurement device of the organic thin film element comprises: at least one sample tube (100) into which a sample (120) is inserted and which is sealed together with a specified gas or vacuum; a cavity resonator (200) into which at least one sample tube is inserted; an electrical characteristic measurement device (310) for the characteristic evaluation of the organic thin film element which is the sample; wiring (130) for connecting the electrical characteristic measurement device (310) and the sample (120) in the sample tube (100); and a light receiving/emitting device (300) for irradiating light to the sample (120), and/or detecting the light emission from the organic thin film element, wherein the cavity resonator irradiates microwaves with a frequency supporting the Zeeman energy splitting of unpaired electrons, sweeps a magnetic field to the sample tube (100), and measures the transition between the energy levels caused by the reversal of the direction of the electron spin. |
