发明名称 |
SEMICONDUCTOR MEMORY APPARATUS INCLUDING DATA COMPRESSION TEST CIRCUIT |
摘要 |
PURPOSE: A flash memory apparatus and a solid state storage system using the same are provided to reduce a chip area by securing the layout of a laminated chip. CONSTITUTION: In a flash memory apparatus and a solid state storage system using the same, a first chip test signal generator(112) is arranged in a first chip. A first chip test signal generator generates a first chip test signal. A second chip test signal generator(122) is arranged in a second chip. A second chip test signal generator generates a second chip test signal. A final data determination unit(200) generates a final test signal.
|
申请公布号 |
KR20110075347(A) |
申请公布日期 |
2011.07.06 |
申请号 |
KR20090131780 |
申请日期 |
2009.12.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
PARK, HEAT BIT;YUN, TAE SIK |
分类号 |
G11C29/12 |
主分类号 |
G11C29/12 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|