发明名称 SEMICONDUCTOR MEMORY APPARATUS INCLUDING DATA COMPRESSION TEST CIRCUIT
摘要 PURPOSE: A flash memory apparatus and a solid state storage system using the same are provided to reduce a chip area by securing the layout of a laminated chip. CONSTITUTION: In a flash memory apparatus and a solid state storage system using the same, a first chip test signal generator(112) is arranged in a first chip. A first chip test signal generator generates a first chip test signal. A second chip test signal generator(122) is arranged in a second chip. A second chip test signal generator generates a second chip test signal. A final data determination unit(200) generates a final test signal.
申请公布号 KR20110075347(A) 申请公布日期 2011.07.06
申请号 KR20090131780 申请日期 2009.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, HEAT BIT;YUN, TAE SIK
分类号 G11C29/12 主分类号 G11C29/12
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