发明名称 Purge step-controlled sequence of processing semiconductor wafers
摘要 A method of processing semiconductor substrates includes: depositing a film on a substrate in a reaction chamber; evacuating the reaction chamber without purging the reaction chamber; opening a gate valve and replacing the substrate with a next substrate via the transfer chamber wherein the pressure of the transfer chamber is controlled to be higher than that of the reaction chamber before and while the gate valve is opened; repeating the above steps and removing the substrate from the reaction chamber; and purging and evacuating the reaction chamber, and cleaning the reaction chamber with a cleaning gas.
申请公布号 US7972961(B2) 申请公布日期 2011.07.05
申请号 US20080248741 申请日期 2008.10.09
申请人 ASM JAPAN K.K. 发明人 SUGIYAMA TORU;NAKANO RYU
分类号 H01L21/44;C23C16/00;H01L21/20 主分类号 H01L21/44
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