| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an analog/digital (A/D) conversion method, X-ray image detector and X-ray apparatus which can greatly reduce conversion time while keeping quantization accuracy at a relatively high level. <P>SOLUTION: The A/D conversion method has following steps: generating n pieces of reference voltages V<SB>i</SB>by inputting n-th order binary data, wherein, within i=1, ..., n, (n-i)-th order is 1 and other orders are 0; setting i to 1, and an accumulated electricity level V<SB>r(1)</SB>to a reference voltage V<SB>1</SB>; at the comparison step, comparing an analog image signal and the accumulated electricity level V<SB>r(i)</SB>, and when the analog image signal is larger than the accumulated electricity level V<SB>r(i)</SB>, setting an (n-i)-th order of a digital image signal to 1, i to i+1, and V<SB>r(i)</SB>to V<SB>r(i-1)</SB>+V<SB>i</SB>, and then back to the comparison step; when an analog image signal is smaller than the accumulated electricity level V<SB>r(i)</SB>, setting an (n-i)-th order of the digital image signal to 0, i to i+1, and V<SB>r(i)</SB>to V<SB>r(i-1)</SB>-V<SB>i</SB>, and then back to the comparison step. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
