| 摘要 |
PURPOSE: A test apparatus for a driving integrated circuit(IC) chip is provided to implement a test process with respect to the wire short-circuit and the leakage current of the driving IC chip including additional test printed circuit board and socket. CONSTITUTION: A receiving part(220) is formed in a socket(200) in order to receive a driving IC chip(210). A plurality of contact pins(230) is formed in the receiving part. A test printed circuit board(120) applies a test signal to the driving IC chip. A socket support(130) connects the socket and the test printed circuit board. A guide hole(131) is formed in the socket support in a structure corresponding to the structure of the socket. |
