发明名称 |
METHODS FOR MAKING OXIDE THIN LAYER TRANSISTOR USING REACTIVE SPUTTERING METHOD |
摘要 |
PURPOSE: A method for manufacturing an oxide thin film transistor using a reactive sputtering method is provided to form an insulation layer by a reactive sputtering method, thereby reducing physical damage to a substrate. CONSTITUTION: Source and drain electrodes, a channel layer(30), a gate insulation layer(40), and a gate electrode(50) are formed on a substrate. The substrate includes a flexible substrate. An insulation layer is patterned. The temperature of the substrate is maintained up to 300°C at room temperature when the substrate is deposited during the process of forming the insulation layer.
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申请公布号 |
KR20110073179(A) |
申请公布日期 |
2011.06.29 |
申请号 |
KR20100034643 |
申请日期 |
2010.04.15 |
申请人 |
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE |
发明人 |
CHEONG, WOO SEOK;YOON, SUNG MIN;HWANG, CHI SUN |
分类号 |
H01L21/31;H01L21/203;H01L21/786 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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地址 |
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