发明名称 METHODS FOR MAKING OXIDE THIN LAYER TRANSISTOR USING REACTIVE SPUTTERING METHOD
摘要 PURPOSE: A method for manufacturing an oxide thin film transistor using a reactive sputtering method is provided to form an insulation layer by a reactive sputtering method, thereby reducing physical damage to a substrate. CONSTITUTION: Source and drain electrodes, a channel layer(30), a gate insulation layer(40), and a gate electrode(50) are formed on a substrate. The substrate includes a flexible substrate. An insulation layer is patterned. The temperature of the substrate is maintained up to 300°C at room temperature when the substrate is deposited during the process of forming the insulation layer.
申请公布号 KR20110073179(A) 申请公布日期 2011.06.29
申请号 KR20100034643 申请日期 2010.04.15
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 CHEONG, WOO SEOK;YOON, SUNG MIN;HWANG, CHI SUN
分类号 H01L21/31;H01L21/203;H01L21/786 主分类号 H01L21/31
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